Particle characterization

Liquid

Do you know all the properties of the (nano) particles in your products? By optimizing the particle characteristics you are able to improve your (end) product, guarantee quality and optimize your production process. Every product has its own characteristics and for every process we have analytical instruments available that measure particle size, distribution, shape or charge.

We offer high-quality instruments from the CPS, Microtrac and EOS brands for particle characterization in liquids and slurries. The differential sedimentation (DCS) technique of CPS has an extremely high resolution and can accurately measure very small (nano) particles. Microtrac uses dynamic light scattering (DLS), laser diffraction (LD) and dynamic image analysis (DIA) as a measurement method and can measure both dry particles and particles in liquids. The range in which Microtrac can measure is much larger, but the resolution is lower. However, Microtrac can also measure in-line / on-line. EOS uses an optical method and is ideal for mixtures of particles.