High-resolution particle analysis

EOS

The CLASSIZER™ ONE provides high-resolution particle analysis of submicron and micron-sized particles in liquids using the latest particle characterization technology, SPES (Single Particle Extinction and Scattering). This technology offers significant advantages for the chemical industry by delivering detailed insights into materials such as specialty chemicals, abrasives, pigments, inks, paints, cosmetic powders, polymeric particle populations in heterogeneous liquids, and biobased nanomaterials.

Characterizing these particles is essential for optimizing product quality, stability, and performance across a wide range of applications. The CLASSIZER™ ONE delivers higher resolution and more detailed information compared to traditional techniques like DLS (Dynamic Light Scattering) and LD (Laser Diffraction), making it ideal for analyzing particles in complex systems such as inks, coatings, and cosmetic powders.

Key benefits

Broad applicability in turbid samples.

Measure both submicron and micron particles in high resolution.

Provides more particle details than other optical techniques.

More information

Discover the benefits of advanced particle characterization! Download the CLASSIZER™ ONE brochure and see how this technology can enhance your analysis processes.

Receive information immediately

SPES particle characterization method game changer for existing and future biobased nanomaterials

Nanomaterials often consist of mixtures of fully or partially biobased materials. Think of biomedical materials and polymer mixtures. In R&D and quality control of these mixtures, traditional methods such as LD and DLS provide averaged data over the entire sample. In doing so, all particles are considered the same, just with different sizes. This can be a limitation in various R&D and QC tasks. SPES particle characterization method solves this problem.

Characterizing submicron and micron-sized particles in high resolution in paints, inks, coatings, and polymers.

The added value of this optical method becomes evident when heterogeneous samples need to be measured. Even when the properties of each component are known, traditional methods provide average data for the entire sample, treating all particles as the same, only differing in size. This can be a limitation for various R&D and QC tasks. The Single Particle Extinction and Scattering (SPES) method solves this problem.

High-resolution particle analysis

Key benefits

What would you like to measure?