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Revolutionizing particle analysis

EOS

The CLASSIZER™ ONE, equipped with innovative SPES technology (Single Particle Extinction and Scattering), offers unparalleled capabilities for analyzing submicron and micron-sized particles in liquids. This advanced optical method provides more detailed and simultaneous particle information than traditional techniques such as DLS (Dynamic Light Scattering) and LD (Laser Diffraction), all in very high resolution.

For the agricultural industry, the CLASSIZER™ ONE offers valuable applications such as:
Agricultural Chemical Analysis: Optimize pesticides, fertilizers, and soil amendments by precisely measuring particle size and distribution.
Study of Biobased Nanomaterials: Support sustainable agriculture with new, environmentally friendly, and effective materials.
Environmental Research: Conduct eco- and cytotoxicological studies to assess the impact of particles on ecosystems.

The CLASSIZER™ ONE performs excellently in polydisperse suspensions, making it a reliable instrument for complex systems. Whether it’s pigments, paints, food, or biological samples, this technology allows researchers to enhance their products and processes with unmatched precision.

Key benefits

Wide applicability in turbid samples
Measure both submicron and micron-sized particles in high resolution
Simultaneously provides information about submicron and larger micron particles
Offers more detailed particle information than other optical techniques
More information

Request the brochure of the CLASSIZER™ ONE here.

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SPES particle characterization method game changer for existing and future biobased nanomaterials

Nanomaterials often consist of mixtures of fully or partially biobased materials. Think of biomedical materials and polymer mixtures. In R&D and quality control of these mixtures, traditional methods such as LD and DLS provide averaged data over the entire sample. In doing so, all particles are considered the same, just with different sizes. This can be a limitation in various R&D and QC tasks. SPES particle characterization method solves this problem.

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