In-line 3D dynamic image analysisMicrotrac
Dynamic image analysis (DIA) is the most recent and advanced particle characterization technique. This technique has a high resolution with which different size and shape parameters are measured. The thickness (T), can only be measured with Microtrac's patented 3D technology.
With the unique 3D image analysis technology from Microtrac you are able to measure all shape, size and thickness parameters of your product in real time and with high resolution. The three-dimensional image that is created of the particles, in real-time and continuously, gives you important information about your production process. In just a few seconds, the Microtrac PartAn displays up to 32 different particle parameters within a range of 0.035 to 35 millimeters. This technique is uncomplicated, easy to use, in-line available and suitable for many industries. It can also be linked to any industrial control system.
Download the brochure of the Microtrac Image Analysis Part An range here.
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