Gain valuable insight into your product properties with the CPS Disc Centrifuge. Accurately measure particle size distributions in suspensions and emulsions.
Dynamic Image Analysis (DIA) is one of the most advanced and widely used techniques for particle characterization. It delivers high-resolution measurements of multiple particle size and shape parameters for every individual particle. However, the smallest particle dimension, particle thickness (T), can only be measured using Microtrac's patented 3D imaging technology.
With Microtrac's unique 3D image analysis technology, you obtain high-resolution measurements of particle size, shape, and thickness in real time. The resulting three-dimensional representation of each particle provides valuable insight into both product characteristics and process performance.
Within just a few seconds, the Microtrac PartAn reports up to 32 particle parameters across a measurement range of approximately 0.03 to 30 mm (optionally up to 135 mm). This user-friendly technology is easy to operate and suitable for a wide variety of industrial applications.
Continuous inline measurement of particle size and shape
Unique 3D analysis, including particle thickness (T)
Up to 32 particle parameters available in real time
High measurement resolution and accuracy
Measurement range from approximately 0.03 to 30 mm (optional up to 135 mm)
High-speed measurements for continuous process monitoring
Immediate insight into process variations and product quality
Easy integration with industrial control systems
Suitable for a wide range of industries
Our VCA-certified specialists understand both your instrumentation and application and provide fast, expert support on site.
We support you throughout every stage of the process, from selection and integration to calibration, data interpretation, and maintenance.
We combine our expertise, instrumentation, and service to ensure your measurement solutions deliver optimal performance and maximum value.
Do you have a question or would you like to discuss your measurement challenges? Our specialists will be happy to help you find the most suitable solution.