Accurately measure moisture content in your product, regardless of size, color, bulk density, or mass, with TEWS' patented microwave technology.
Innovative solutions for hyperspectral material analysis
Headwall
The MV.C NIR offers advanced hyperspectral analysis for real-time inspection and quality control (900-1700 nm).
De voordelen van het product
The MV.C NIR hyperspectral sensor from Headwall, with a spectral range of 900 to 1700 nm, delivers a powerful solution for precise material inspection and analysis across various industries. This sensor captures detailed spectral data, essential for identifying compositions, detecting contaminants, and assessing quality variations in solid materials such as plastics, minerals, and pharmaceutical products.
By integrating with perClass Mira Software, users can leverage machine learning models for advanced spectral analysis and process optimisation. Designed for both laboratory use and inline inspection, the MV.C NIR provides an efficient and non-destructive solution for real-time quality control. Paired with the perClass Mira Stage, the system delivers a comprehensive solution for complex analyses and production process improvement.
- Wide spectral range (900-1700 nm). Non-destructive analysis. Real-time inspection. Suitable for laboratory use and inline inspection of solid materials in industrial environments. Compatible with perClass Mira for automated spectral analysis and machine learning-based anomaly detection.
Certified engineers
Our VCA-certified specialists understand both your instrumentation and application and provide fast, expert support on site.
Knowledge partner
We support you throughout every stage of the process, from selection and integration to calibration, data interpretation, and maintenance.
Maximum return on investment
We combine our expertise, instrumentation, and service to ensure your measurement solutions deliver optimal performance and maximum value.
Discuss your challenge
Do you have a question or would you like to discuss your measurement challenges? Our specialists will be happy to help you find the most suitable solution.
Measure all shape, size and thickness parameters of particles in solids at high speed and in real-time with dynamic image analysis (DIA)
Measure particle shape, size, and thickness parameters in solids with high-speed, real-time dynamic image analysis for chemical processes.