High-resolution particle analysis

EOS

High-resolution particle analysis with CLASSIZER™ ONE: ideal for inks, paints, cosmetics, and nanomaterials using advanced SPES technology.

De voordelen van het product

The CLASSIZER™ ONE provides high-resolution particle analysis of submicron and micron-sized particles in liquids using the latest particle characterization technology, SPES (Single Particle Extinction and Scattering). This technology offers significant advantages for the chemical industry by delivering detailed insights into materials such as specialty chemicals, abrasives, pigments, inks, paints, cosmetic powders, polymeric particle populations in heterogeneous liquids, and biobased nanomaterials.

Characterizing these particles is essential for optimizing product quality, stability, and performance across a wide range of applications. The CLASSIZER™ ONE delivers higher resolution and more detailed information compared to traditional techniques like DLS (Dynamic Light Scattering) and LD (Laser Diffraction), making it ideal for analyzing particles in complex systems such as inks, coatings, and cosmetic powders.

  • Broad applicability in turbid samples. Measure both submicron and micron particles in high resolution. Provides more particle details than other optical techniques.

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Certified engineers

Our VCA-certified specialists understand both your instrumentation and application and provide fast, expert support on site.

Knowledge partner

We support you throughout every stage of the process, from selection and integration to calibration, data interpretation, and maintenance.

Maximum return on investment

We combine our expertise, instrumentation, and service to ensure your measurement solutions deliver optimal performance and maximum value.

Discuss your challenge

Do you have a question or would you like to discuss your measurement challenges? Our specialists will be happy to help you find the most suitable solution.

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